Agilent Technologies will Demonstrate Test Solutions at International Symposium on Electromagnetic Compatibility

Agilent Technologies Inc will demonstrate its test solutions at the IEEE International Symposium on Electromagnetic Compatibility (Booth 917/919) in Pittsburgh, Aug. 5-10.

Agilent will demonstrate the following solutions at the symposium:

SystemVue 2012.06: With this software package, designers can build mid-channel repeater and opto-link models for high-speed digital chip-to-chip and rack-to-rack links, saving months of programming time compared to hand coding in C. Those models can then be shipped to repeater and opto-link customers for integration into their complete end-to-end channel simulation using the Transient/Convolution simulator in the Advanced Design System.

The Agilent N9038A MXE: This full-compliance EMI receiver does CISPR, MIL STD and DO-160 measurements. Diagnostic tools include spectrum analysis, spectrogram, strip chart and meters. Precompliance conducted- and radiated-emissions testing can be achieved when the N6141A EMI measurement application is coupled with an Agilent X-Series signal analyzer.

The FieldFox RF analyzer and FieldFox vector network analyzer: These handheld units are known for being field-ready and rugged, with the ability to perform multiple functions, including cable and antenna analysis, spectrum analysis and vector network analysis with QuickCal, a calibration capability that allows engineers to calibrate the network analyzer without carrying a calibration kit into the field.

The new Agilent PNA-L vector network analyzer: This instrument offers the highest performance in a mid-range VNA with lower cost and future-proof capabilities. Agilent will use the PNA-L to demonstrate EMC chamber characterization.

The Agilent E5061B-3L5 ENA LF-RF vector network analyzer: A member of the industry-standard ENA Series of network analyzers, the E5061B addresses a broad range of measurement needs for designers of electronic components and circuits, from low to high frequencies.

Dr. Colin Warwick, product manager for high-speed digital design, Agilent EEsof EDA, will present The Power of S-Parameters for High Speed Digital Design as part of the EMC Symposium Global University Signal Integrity course series. The course will cover the use of S-parameter models and offer tricks and tips to avoid pitfalls that can sometimes crop up.