EMSCAN will be showcasing the world's largest real-time antenna pattern measurement system: RFX2 and the world's fastest high-resolution EMC/EMI scanner: ERX+ at the IEEE IMS 2016 at the Moscone Center in San Francisco between May 24 and 26.
The ERX+ helps you to rapidly diagnose and solve EMC/EMI problems in a single design cycle. It provides unique pre and post-EMC compliance testing that images real-time emissions. With the ERX+ you can diagnose and debug EMC/EMI problems between 150 kHz and 8 GHz with seven different levels of resolution (120 microns - 7.5 mm).
The RFX2 characterizes antennas without the need for a chamber. They provides far-field patterns, bisections, EIRP and TRP in less than a second. Novel near-field results, including amplitude, polarity and phase give insights into the root causes of antenna performance challenges and help troubleshoot far-field radiation patterns. We wrote about another product that does this from MegiQ earlier this week.
EMSCAN will also provide information about the RFxpert OTA Phantom Head+Hand Test Kit which allows mobile device manufacturers & wireless service providers to measure TRP of their devices in seconds on their lab-bench.
Visit booth #1332 at IMS 2016 in San Francisco between May 24 and 26, 2016 to learn more.