R&S America and DA-Integrated to Develop On-Wafer Production Test System for RF & mmWave ICs

Rohde & Schwarz America (RSA) and DA-Integrated have collaborated to develop an on-wafer RFIC production test system for RF and millimeter wave devices. The system uses Standard ATE Production IC Test Systems at DA-Integrated along with R&S ZVA 67 GHz Vector Network Analyzer (VNA) to create a robust volume production test system capable of handling advanced RF & millimeter wave integrated circuit devices. New RF and millimeter wave applications, such as 5G mobile, automotive radar, active array antennas, WiGig and other wireless broadband systems, require appropriate on-wafer production test capability as a complement to the production robustness, speed and cost structures associated with automated test equipment (ATE) systems.

With IC technology moving to higher frequencies, design margins are shrinking, making the accuracy and precision of test instruments more critical in production testing. With this new system, customers benefit from the high volume scalability and robustness of the ATE system combined with the speed and accuracy of the R&S vector network analyzer as required to test these new devices. R&S VNAs are designed to provide highly accurate and traceable results, all while maintaining the industry's fastest measurement speed and highest port count for parallel testing.

Click here to learn more about DA-Integrated's Production IC Test System.