1 Port VNA to Measure Dielectric Substrate Properties from 3 MHz to 6 GHz

Copper Mountain along with Compass Technology has released a new Epsilometer solution for measuring the dielectric properties of materials. It measures dielectric substrate materials at frequencies from 3 MHz up to 6 GHz and can accommodate sheet specimens 0.3 to 3 mm thick.

Unlike previous dielectric analysis technologies, the new method uses computational electromagnetic modeling to invert the dielectric permittivity and loss. This represents a significant advance over conventional methods, which use analytical approximations and are limited to frequencies below 1 GHz.

With the launch of Epsilometer, Copper Mountain delivers another solution that combines its metrology-grade portable network analyzers with subject matter expertise to solve important industry problems. Accurate determination of dielectric properties of radomes, packaging, and microwave substrates is important for design of functioning wireless devices for the Internet of Things and emerging 5G applications.

This innovative Epsilometer is based on Copper Mountain's R60 1-Port Vector Network Analyzer.

Compass Technology Group (CTG) is a leading provider of cutting-edge research and manufacturing in the radio frequency materials characterization arena. Its off-the-shelf and custom-designed materials measurement systems are a combination of innovative hardware such as the Advanced Microwave Mapping Probe (AMMP) and sophisticated specialty software, CTGcalc, with powerful, efficient and easy-to-use algorithmic and graphical processing tools for measuring S-parameters and extracting material properties such as thickness, epsilon and mu. The company offers a wide range of products from focused beam measurement systems to tabletop and handheld tools, many of which have been integrated into automated robotic systems.