Advantest’s RF Testers to be Used in China for Volume Testing of AIoT Devices

Advantest Corporation has installed multiple V93000 Wave Scale RF systems for the production-volume testing of devices for the artificial intelligence of things (AIoT) designed and fabricated in China. The testers are being used to evaluate highly integrated Bluetooth audio system-on-chip (SoC) ICs designed by fabless IC company Bestechnic (Shanghai) and fabricated at Jiangsu Changjiang Electronics Technology (JCET) facility in Jiangyin. Later this year, JCET plans to install additional V93000 Wave Scale RF testers to continue serving the high-volume, cost-sensitive AIoT sector and to prepare to meet the technical challenges of the emerging 5G market segment.

The V93000 Wave Scale RF platform provides a comprehensive, high-resolution test solution for AIoT and 5G devices at a low cost of test. It leverages the Wave Scale MX, a compact A-class test head and the latest generation of SmarTest 8 software to achieve massive multi-site and in-site parallelism in testing radio-frequency (RF) and mixed-signal ICs for wireless communications. The system’s high throughput dramatically reduces both testing costs and time to market for new IC designs while creating a path for evaluating future 5G devices enabling wireless connectivity.

Wave Scale RF help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both today’s and emerging LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth, and IoT applications. The cards’ advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. Click here for more information on the V93000 Wave Scale RF platform.

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