This Test Solution Reduces Development Time and Production Costs for 5G mmWave Semiconductors

Teradyne, a leading supplier of automated test solutions for semiconductor devices, has introduced the UltraWaveMX44, an UltraFLEX test solution for the new 5G-NR millimeter wave (mmWave) market. The new UltraWaveMX44 instrument enables faster time to market and higher product yields for semiconductor devices used in emerging 5G mmWave applications.

The UltraWaveMX44 supports characterization and production device testing for probe, package, over-the-air and module applications. Its patented active thermal control and NIST traceable integrated calibration circuitry delivers superior instrument performance and tester-to-tester repeatability for frequencies between 6 GHz and 44 GHz. 

The UltraWaveMX44 instrument maintains complete DIB and test cell compatibility with currently released wireless applications, such as LTE and WLAN, making the UltraWaveMX44 the ideal upgrade solution for installed UltraFLEX systems while maximizing return on investment for new system purchases. 

This addition to the UltraFLEX platform leverages the test system’s native features of dedicated background DSP computers, award-winning IGXL software environment, fully integrated debug tools and instrument pattern support to deliver high test cell throughput and fast time to market. This, along with its leading performance, makes the UltraWaveMX44 the premier test solution for the fast-growing 5G market. 

Teradyne has received multiple orders and is currently shipping to customers in the US, Europe, and Asia. Teradyne is now accepting orders for the UltraWaveMX44. For more information, click here.