Anritsu Upgrades its Universal Wireless Test Set to Test LTE-V2X Technology

Anritsu has introduced two software options for its Universal Wireless Test Set MT8870A to measure RF characteristics of 3GPP-compliant LTE-V2X (PC5) devices, helping to facilitate the smooth rollout of cellular-vehicle-to-everything (C-V2X) technology. With the new software option, the MT8870A provides automotive chipset and module manufacturers a cost-efficient instrument that can conduct accurate physical layer (RF) tests of V2X products and devices.

Installing the new options in the MT8870A enables the industry’s fastest, fully automatic, non-signaling-based LTE-V2X TRx tests. The software packages consist of the LTE-V2X Tx Measurement MX887068A and LTE-V2X Waveforms MV887068A. Anritsu developed the MT8870A-based solution to improve the mass-production manufacturing efficiency of V2X devices and chipsets and help accelerate C-V2X service commercialization.

The new software expands the capabilities of the Universal Wireless Test Set MT8870A, which is designed for the mass-production test of multi-standard wireless systems. In addition to LTE-V2X and IEEE 802.11p (DSRC V2X) for automotive designs, the test set also supports the latest 5G sub-6 GHz, LTE, NB-IoT, Cat-M, WLAN and Bluetooth standards.

With four TRx measurement modules installed in the Universal Wireless Test Set MT8870A, four devices-under-test (DUTs) can be connected and measured simultaneously, creating distinct time and cost benefits. Different wireless systems can be measured in parallel, helping further reduce measurement time, as well as the product line test equipment footprint. The MT8870A can be controlled by an external PC.

Anritsu

  • Country: United States
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