ADC32RF45 Image


Analog to Digital Converter by Texas Instruments (317 more products)

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The ADC32RF45 is a 14-bit, 3.0-GSPS, dual-channel, analog-to-digital converter (ADC) that supports RF sampling with input frequencies up to 4 GHz. Designed for high signal-to-noise ratio (SNR), the ADC32RF45 delivers a noise spectral density of -155 dBFS/Hz as well as dynamic range and channel isolation over a large input frequency range.

The buffered analog input with on-chip termination provides uniform input impedance across a wide frequency range and minimizes sample-and-hold glitch energy.  Each ADC channel can be connected to a dual-band, digital down-converter (DDC) with up to three independent, 16-bit numerically-controlled oscillators (NCOs) per DDC for phase-coherent frequency hopping. Additionally, the ADC is equipped with front-end peak and RMS power detectors and alarm functions to support external automatic gain control (AGC) algorithms. 

The ADC32RF45 supports the JESD204B serial interface with subclass 1-based deterministic latency using data rates up to 12.5 Gbps with up to four lanes per ADC. The device is offered in a 72-pin VQFN package (10 mm × 10 mm) and supports the industrial temperature range from -40 to 85 Degrees C.

Product Specifications

  • Part Number
  • Manufacturer
    Texas Instruments
  • Description
    ADC32RF45 Dual-Channel, 14-Bit, 3.0-GSPS, Analog-to-Digital Converter
  • Sample Rate
    2.5 to 12.5 Msps
  • Resolution
    14 Bits
  • Channels
    2 Channels
  • Application
    2G, 3G, 4G, Cellular, Radar, Electronic Warfare
  • Aperture Jitter
    90 fs
  • Package
    72-Pin VQFN
  • Dimensions
    10 mm × 10 mm
  • Operating Temperature
    -40 to 85 Degrees C
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