TS-900e-5G Series

RF Test Set by Marvin Test Solutions

Note : Your request will be directed to Marvin Test Solutions.

TS-900e-5G Series Image

The TS-900e-5G Series from Marvin Test Solutions are 5G mmWave Semiconductor Production Test Systems for applications requiring parallel, multi-site test capabilities. They provide production-proven 44 GHz signal delivery to the device under test (DUT), with optional VNA RF test capabilities to 53 GHz. These systems can support up to 40 independent VNA ports. They use Keysight Technologies’ modular vector network analyzers (VNAs) to deliver exceptional RF measurement performance and repeatability. These systems deliver unmatched phase and amplitude measurement accuracy across the entire band of interest which eliminates test band gaps found with some instruments.

The Keysight M9807A (44 GHz) and M9808A (53 GHz) PXIe VNA instruments are the ideal VNA solution delivering modularity, speed and accuracy. The TS-900e-5G Series implements complete system-level calibration to remove signal path errors, including interconnect points such as cables, connectors, blind mate interfaces, and load board error sources such as board traces and sockets, from the test results. A multi-step process to isolate the device under test (DUT) utilizes the industry standard practice of fixture de-embedding with verification coupons.

The TS-900e-5G Series uses the ATEasy® Test Executive and Software Development Studio which is a comprehensive software development environment featuring a customizable test executive for execution, sequencing, fault analysis and debugging. It is pre-configured with all required instrument drivers, virtual instrument panels, and system self-test to simply start-up and software development activities. Additionally, ICEasy, a suite of software tools for semiconductor test and evaluation is also included and incorporates I-V curve and Shmoo plot tools for analyzing device DC and AC characteristics.

These 5G mmWave Semiconductor Production Test Systems are suitable for mmWave packaged and wafer device test/characterization, pilot production and focused production test and automated failure analysis and test applications.

Product Specifications

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Product Details

  • Part Number
    TS-900e-5G Series
  • Manufacturer
    Marvin Test Solutions
  • Description
    PXIe 5G mmWave Semiconductor Production Test Systems

General Parameters

  • Technology
  • Features
    Intel Core i7, 2.4 GHz, single slot controller 4x4 PCIe bus configuration 8 GB of RAM
  • Integrations
    Vector Network Analyzer
  • Connector
  • Dimension
    TS-900e-5G: 24" D x 22" W x 17" H, TS-900eX-5G: 24" D x 39" W x 35" H
  • Weight
    TS-900e-5G: 125 lbs, TS-900eX-5G: 250 lbs
  • Supply Voltage
    -2 to 7 V
  • Operating Temperature
    0 to 50 Degree C
  • Storage Temperature
    -20 to 60 Degree C

Technical Documents