Probe Cards - Micronics Japan Co., Ltd

4 Probe Cards from Micronics Japan Co., Ltd meet your specification.
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  • Manufacturers : Micronics Japan Co., Ltd
Description:RF Probe Card
Features:
Multi-Die testing of memory devices
Wafer Size:
12-inch
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Description:RF Probe Card
Features:
Suitable formuli-die test, including peripheral pa...
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Description:RF Probe Card
Application:
WLCSP
Features:
Best suited to one-touchdown testing of 12-inch wa...
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Description:RF Probe Card
Features:
Best suited to flip chip wafer testing of micropro...
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