Probe Cards

7 Probe Cards from 2 Manufacturers meet your specification.
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  • Manufacturers : Micronics Japan Co., Ltd, T Plus Co. Ltd.
Description:RF Probe Card
Features:
Multi-Die testing of memory devices
Wafer Size:
12-inch
more info
Description:50 to 1000μm (25um step) Pitch Probe Card DC to 10 GHz
Pitch:
50 to 1000µm (25um step) (Recommended maximum GS (...
Frequency:
DC to 10 GHz
Configuration:
GS, GSG, GSSG, GSGSG
Body Material:
Aluminum Alloy
Contact Cycle:
Over 1M
Contact Pressure:
20 Gram
DC Voltage:
100 V
Connectors:
SMA, SMA - Female
more info
Description:50 to 1000μm (25um step) Pitch Probe Card DC to 10 GHz
Pitch:
50 to 1000µm (25um step) (Recommended maximum GS (...
Frequency:
DC to 40 GHz
Configuration:
GS, GSG, GSSG, GSGSG
Body Material:
Aluminum Alloy
Contact Cycle:
Over 1M
Contact Pressure:
20 Gram
DC Voltage:
100 V
Connectors:
2.92 mm, 2.92 mm - Female
more info
Description:RF Probe Card
Features:
Suitable formuli-die test, including peripheral pa...
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Description:50 to 1000μm (25um step) Pitch Probe Card DC to 10 GHz
Pitch:
50 to 1000µm (25um step) (Recommended maximum GS (...
Frequency:
DC to 67 GHz
Configuration:
GS, GSG, GSSG, GSGSG
Body Material:
Aluminum Alloy
Contact Cycle:
Over 1M
Contact Pressure:
20 Gram
DC Voltage:
100 V
Connectors:
1.85 mm, 1.85 mm - Female
more info
Description:RF Probe Card
Application:
WLCSP
Features:
Best suited to one-touchdown testing of 12-inch wa...
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Description:RF Probe Card
Features:
Best suited to flip chip wafer testing of micropro...
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