Probe Cards

8 Probe Cards from 2 Manufacturers meet your specification.
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  • Manufacturers : Micronics Japan Co., Ltd, GGB Industries
Description:50 to 1250 microns Pitch Probe Card DC to 40 GHz
Pitch:
50 to 1250 microns
Frequency:
DC to 40 GHz
Configuration:
GS, GSG, SG
Body Material:
Beryllium Copper
Connectors:
K Type - Female, SMA, 3.5 mm
more info
Description:RF Probe Card
Features:
Multi-Die testing of memory devices
Wafer Size:
12-inch
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Description:50 to 1250 microns Pitch Probe Card DC to 50 GHz
Pitch:
50 to 1250 microns
Frequency:
DC to 50 GHz
Configuration:
GS, GSG, SG
Body Material:
Beryllium Copper
Connectors:
2.4 mm - Female
more info
Description:50 to 1250 microns Pitch Probe Card DC to 67 GHz
Pitch:
50 to 1250 microns
Frequency:
DC to 67 GHz
Configuration:
GS, GSG, SG
Body Material:
Beryllium Copper
Connectors:
V Type - Female, 2.4 mm
more info
Description:RF Probe Card
Features:
Suitable formuli-die test, including peripheral pa...
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Description:50 to 1250 microns Pitch Probe Card DC to 110 GHz
Pitch:
50 to 1250 microns
Frequency:
DC to 110 GHz
Configuration:
GS, GSG, SG
Body Material:
Beryllium Copper
Connectors:
1.0 mm
more info
Description:RF Probe Card
Application:
WLCSP
Features:
Best suited to one-touchdown testing of 12-inch wa...
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Description:RF Probe Card
Features:
Best suited to flip chip wafer testing of micropro...
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