Probe Stations & Systems - FormFactor Inc.

13 Probe Stations & Systems from FormFactor Inc. meet your specification.

Probe Stations & Systems from FormFactor Inc. are listed on everything RF. We have compiled a list of Probe Stations & Systems from the FormFactor Inc. website/catalog and made their products searchable by specification. Use the filters to narrow down on products based on your requirements. Download datasheets and request quotes for products that you find interesting. Your inquiry will be directed to FormFactor Inc. and their distributors in your region.

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  • Manufacturers: FormFactor Inc.
Description:Autonomous Wafer Probing System for RF and mmWave Measurements
Type:
Automatic
Frequency:
Upto 500 GHz
more info
Description:220 GHz Probe Station for On-Wafer Characterization of 5G/6G Devices
Type:
Automatic, Manual
Frequency:
170 to 220 GHz
more info
Description:150 mm Manual Probe System
Type:
Automatic, Manual
Measurements Type:
DC, RF
Chuck Size:
150 mm
Chuck to Platen Height:
16 mm
Chuck Travel Range:
155 x 155 mm
Chuck Travel Resolution:
5 µm
Microscope Travel Resolution:
5 µm
Microsope Movement Range:
50 x 50 mm
more info
Description:Semi/Fully-Automated Probe System for DC/RF/mmWave/THz Applications
Type:
Automatic, Manual
Frequency:
DC to 1 GHz
Measurements Type:
DC, RF
Chuck Size:
200 mm
Chuck Travel Range:
203 x 203 mm
Chuck Travel Resolution:
0.2 µm
Microscope Travel Resolution:
1 µm
Microsope Movement Range:
35 mm
Connectors:
BNC
more info
Description:200 mm Manual Probing Solution for RF Applications up to 67 GHz
Type:
Manual
Frequency:
40 to 67 GHz
Measurements Type:
RF
Chuck Size:
200 mm
Microsope Movement Range:
50 x 50 mm
more info
Description:300 mm Semi-/ Fully-automated Probe System for Ultra Low Noise Measurements
Type:
Automatic
Measurements Type:
DC, RF
Chuck Size:
300 mm
Chuck to Platen Height:
43 mm
Chuck Travel Range:
301 x 501 mm
Chuck Travel Resolution:
0.2 µm
Microscope Travel Resolution:
0.2 µm
Microsope Movement Range:
10 mm
Connectors:
BNC
more info
Description:200 mm Manual Probe System
Type:
Manual
Frequency:
DC to 1 KHz
Measurements Type:
DC, RF
Chuck Size:
200 mm
Chuck to Platen Height:
17 to 22 mm
Chuck Travel Range:
200 x 200 mm
Chuck Travel Resolution:
1 µm
Microscope Travel Resolution:
5 µm
Microsope Movement Range:
50 x 50 mm
Connectors:
BNC
more info
Description:200 mm Manual and Semi-automated Probe Systems
Type:
Semi Automatic
Frequency:
DC to 1 GHz
Measurements Type:
DC, RF
Chuck Size:
200 mm
Chuck to Platen Height:
14 mm
Chuck Travel Range:
203 x 203 mm
Chuck Travel Resolution:
1 µm
Microscope Travel Resolution:
1 µm
Microsope Movement Range:
5 mm
Connectors:
BNC
more info
Description:300 mm Semi-/ Fully-automated Probe System
Type:
Automatic
Frequency:
DC to 2.5 Hz
Measurements Type:
DC, RF
Chuck Size:
300 mm
Chuck to Platen Height:
43 mm
Chuck Travel Range:
301 x 501 mm
Chuck Travel Resolution:
0.2 µm
Microscope Travel Resolution:
0.2 µm
Microsope Movement Range:
10 mm
Connectors:
BNC
more info
Description:200 mm Semi-/ Fully-automated Probe System
Type:
Manual
Measurements Type:
DC, RF
Chuck Size:
200 mm
Chuck to Platen Height:
32 mm
Chuck Travel Range:
205 x 205 mm
Chuck Travel Resolution:
0.5 µm
more info

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