1. everything RF
  2. Test & Measurement
  3. RF Probes & Systems
  4. Probe Stations & Systems
  5. Automatic Probe Stations & Systems

Automatic Probe Stations & Systems

10 Automatic Probe Stations & Systems from 2 Manufacturers meet your specification.

Automatic Probe Stations & Systems are used to control the position of probes used for semiconductor device and wafer testing. Automatic Probe Stations & Systems from the leading manufacturers are listed below. Use the parametric search tools to narrow down on products by frequency, type, chunk size and various other parameters. View product details, download datasheets and get quotes on matching products.

Selected Filters Reset All
  • Type: Automatic
Filters
Autonomous RF Image
 Download Datasheet
 Request Quote

FormFactor Inc. - Autonomous RF

Automatic Probe Stations & System from FormFactor Inc.
www.formfactor.com
 Download Datasheet
 Request Quote
Description:Autonomous Wafer Probing System for RF and mmWave Measurements
Type:
Automatic
Frequency:
Upto 500 GHz
more info
SA-12 Image
 Download Datasheet
 Request Quote

SemiProbe - SA-12

Automatic Probe Stations & System from SemiProbe
 Download Datasheet
 Request Quote
Description:Semiautomatic probe system
Type:
Automatic
Chuck Size:
300 mm
Chuck Travel Range:
305 x 305 mm
Chuck Travel Resolution:
0.1 µm
Microscope Travel Resolution:
0.5 µm
Microsope Movement Range:
15 mm
more info
220 GHz Broadband Solution Image
 Download Datasheet
 Request Quote

FormFactor Inc. - 220 GHz Broadband Solution

Automatic Probe Stations & System from FormFactor Inc.
www.formfactor.com
 Download Datasheet
 Request Quote
Description:220 GHz Probe Station for On-Wafer Characterization of 5G/6G Devices
Type:
Automatic, Manual
Frequency:
170 to 220 GHz
more info
MPS150 Image
 Download Datasheet
 Request Quote

FormFactor Inc. - MPS150

Automatic Probe Stations & System from FormFactor Inc.
www.formfactor.com
 Download Datasheet
 Request Quote
Description:150 mm Manual Probe System
Type:
Automatic, Manual
Measurements Type:
DC, RF
Chuck Size:
150 mm
Chuck to Platen Height:
16 mm
Chuck Travel Range:
155 x 155 mm
Chuck Travel Resolution:
5 µm
Microscope Travel Resolution:
5 µm
Microsope Movement Range:
50 x 50 mm
more info
FA-4 Image
 Download Datasheet
 Request Quote

SemiProbe - FA-4

Automatic Probe Stations & System from SemiProbe
 Download Datasheet
 Request Quote
Description:Fully Automatic probe system
Type:
Automatic
Measurements Type:
DC, RF
Chuck Size:
100 mm
Chuck Travel Range:
105 x 105 mm
Chuck Travel Resolution:
0.1 µm
Microscope Travel Resolution:
0.5 µm
Microsope Movement Range:
15 mm
more info
SUMMIT200 Image
 Download Datasheet
 Request Quote

FormFactor Inc. - SUMMIT200

Automatic Probe Stations & System from FormFactor Inc.
www.formfactor.com
 Download Datasheet
 Request Quote
Description:Semi/Fully-Automated Probe System for DC/RF/mmWave/THz Applications
Type:
Automatic, Manual
Frequency:
DC to 1 GHz
Measurements Type:
DC, RF
Chuck Size:
200 mm
Chuck Travel Range:
203 x 203 mm
Chuck Travel Resolution:
0.2 µm
Microscope Travel Resolution:
1 µm
Microsope Movement Range:
35 mm
Connectors:
BNC
more info
CM300xi ULN Image
 Download Datasheet
 Request Quote

FormFactor Inc. - CM300xi ULN

Automatic Probe Stations & System from FormFactor Inc.
www.formfactor.com
 Download Datasheet
 Request Quote
Description:300 mm Semi-/ Fully-automated Probe System for Ultra Low Noise Measurements
Type:
Automatic
Measurements Type:
DC, RF
Chuck Size:
300 mm
Chuck to Platen Height:
43 mm
Chuck Travel Range:
301 x 501 mm
Chuck Travel Resolution:
0.2 µm
Microscope Travel Resolution:
0.2 µm
Microsope Movement Range:
10 mm
Connectors:
BNC
more info
CM300xi Image
 Download Datasheet
 Request Quote

FormFactor Inc. - CM300xi

Automatic Probe Stations & System from FormFactor Inc.
www.formfactor.com
 Download Datasheet
 Request Quote
Description:300 mm Semi-/ Fully-automated Probe System
Type:
Automatic
Frequency:
DC to 2.5 Hz
Measurements Type:
DC, RF
Chuck Size:
300 mm
Chuck to Platen Height:
43 mm
Chuck Travel Range:
301 x 501 mm
Chuck Travel Resolution:
0.2 µm
Microscope Travel Resolution:
0.2 µm
Microsope Movement Range:
10 mm
Connectors:
BNC
more info
FA-6 Image
 Download Datasheet
 Request Quote

SemiProbe - FA-6

Automatic Probe Stations & System from SemiProbe
 Download Datasheet
 Request Quote
Description:150 mm Fully Automatic Probe System
Type:
Automatic
Measurements Type:
DC, RF
Chuck Size:
150 mm
Chuck Travel Range:
155 x 155 mm
Chuck Travel Resolution:
0.1 µm
Microscope Travel Resolution:
0.5 µm
Microsope Movement Range:
15 mm
more info
EPS200MMW Image
 Download Datasheet
 Request Quote

FormFactor Inc. - EPS200MMW

Automatic Probe Stations & System from FormFactor Inc.
www.formfactor.com
 Download Datasheet
 Request Quote
Description:200 mm Manual Probe Station & System for mmWave, THz and Load-Pull Applications
Type:
Automatic
Frequency:
Up to 110 GHz
Measurements Type:
RF
Chuck Size:
200 mm
Chuck Travel Range:
200 mm
Microsope Movement Range:
150 x 100 mm
more info
Have a Custom Requirement?

FiltersReset All

Manufacturers

Type

Chuck Size

Frequency

 
 
Apply
Probe Station & System Manufacturers