Advanced Spectrum Measurements for Modern Radios
November 14, 2017
8am PT / 11am ET
Advanced spectrum measurements like adjacent channel leakage ratio and spurious emissions often require advanced knowledge of best measurement practices and instrumentation architectures. In this presentation, we’ll explain how to tackle these often-difficult measurements using high performance RF signal analyzers.
Xavier Gosselin is an RF Applications Engineering Specialist at National Instruments. His focus is on semiconductor characterization and production test. He works closely with cellular envelope tracking and digital predistortion applications. Xavier holds a B.Eng in Mechanical Engineering from McGill University.