Advanced Spectrum Measurements for Modern Radios

  • Webinar Date

    November 14, 2017

  • Webinar Time

    8am PT / 11am ET

Webinar Overview

Advanced spectrum measurements like adjacent channel leakage ratio and spurious emissions often require advanced knowledge of best measurement practices and instrumentation architectures. In this presentation, we’ll explain how to tackle these often-difficult measurements using high performance RF signal analyzers.

Presenter Bio:

Xavier Gosselin is an RF Applications Engineering Specialist at National Instruments. His focus is on semiconductor characterization and production test. He works closely with cellular envelope tracking and digital predistortion applications. Xavier holds a B.Eng in Mechanical Engineering from McGill University.