Reducing VNA Test Costs and Decreasing Test Times
September 23, 2015
8am PT/ 11am ET/ 3pm UTC
Traditional bench top VNAs have been used in the R&D and manufacturing environment when S-Parameters or both Amplitude and Phase information is needed. This webinar will look at some new solutions and architectures for VNAs that have the net effect of reducing the cost of making these measurements as well as speeding throughput of systems in the manufacturing environment. This enhanced throughput has the net effect of reducing overall manufacturing costs. We will also look at some new VNA products and architectures now available from Anritsu.
Who should attend:
Design and Manufacturing engineers who are interested in reducing the overall cost of making VNA based measurements as well as those looking for reduced test times.
Joe Mallon has over 28 years of experience working in the RF and microwave industry on both the commercial wireless as well as the space and defense markets. Throughout his career, he has held a variety of positions including engineering, sales and sales management. Joe has held positions at Motorola, Agilent Technologies, Lockheed Martin, Anaren Microwave and Crane Electronics. In his current position at Anritsu he serves as a Business Development Manager for Anritsu’s VectorStar line of VNAs. Joe holds a BSEE degree from Drexel University in Philadelphia, Pennsylvania.