Accelerate Time to Market with Advanced High-Frequency Measurement Solutions
Wednesday, March 7, 2018
2:00 PM ET | 11:00 AM PT
Market dynamics and their impact on semiconductor test methodologies
With so many applications now driving the use of higher frequency semiconductors, along with the costs coming down to a level that is affordable to the consumer market, we are seeing more development and production of devices with frequencies higher than the typical 4G and WiFi frequencies of today. Emerging applications of mm-wave, and even THz, include 5G mobile, automotive radar, gesture recognition radar, advanced WiFi, wearable devices, imaging and more. The abundance of these applications and consumer growth demand more advanced development and the need for on-wafer measurements up to the sub-THz and THz frequencies. Of course, this development needs advanced analytical probe stations and probes that perform accurate and reliable measurements at these super high frequencies. Integrated solutions with industry partners can provide a complete turn-key offering that helps meet customers’ requirements for faster time to market. In this presentation you will learn about the new market drivers, and some unique solutions available to accelerate time to profitability.
Director, RF Segment Business Development
Anthony Lord is Director, RF Segment Business Development for FormFactor’s Systems Business Unit. Anthony has been involved in many organizational roles within the company, including applications engineering, sales management, product line management, strategic marketing as well as segment marketing, and has been actively involved in the semiconductor and RF industry for 24 years. Anthony has published several papers on RF on-wafer measurements, and has hosted numerous workshops and presentations on on-wafer test applications. Currently, Anthony is exploring where the RF semiconductor market is heading, and how to position future products to enable engineers to make the most accurate measurements with the fastest time to data.