Avoid Design Hazards and Improve Performance with Electro-Thermal Simulation

  • Date: ┬áJune 4, 2015
  • Event Time: 10am PT/ 1pm ET/ 5pm UTC

Webinar Overview

Why this webcast is important:
Did you know that if you underestimate transistor junction temperature by just a few degrees, your chip could fail in half the time you expected? Chip temperature directly impacts several chip failure mechanisms, such as electromigration. Temperature also impacts performance of digital, analog and RF ICs. Despite the importance of IC thermal effects, traditional methods to analyze chip temperature, such as IR scans and legacy thermal modeling tools, do not typically provide realistic temperature estimates. This webcast will explore the use of full electro-thermal analysis to provide accurate electrical and thermal results, with full chip capacity and submicron resolution.

Who should view:
IC, RFIC, MMIC and RF module designers will learn how electro-thermal analysis can optimize design performance and prevent failures due to thermal issues.