How to Avoid Common Mistakes with Vector Network Analyzer (VNA) Measurements

  • Date:  Wednesday, June 27, 2018
  • Time: 2:00 PM ET | 11:00 AM PT

Webinar Overview

Frequencies up to 8 GHz were considered high frequency not too long ago. Applications such as 5G, WiFi, modern radars, ubiquitous sensors, etc. require measurements at frequencies well beyond 8 GHz. At millimeterwave frequencies, component characterization becomes challenging in two ways. 1) measurement uncertainty increases and 2) design margins decrease. In this webinar measurement professionals will learn how to get ready for component characterization at millimeterwave frequencies.
Attendees will learn:
typical measurements used for component characterization at millimeterwave frequencies
key factors that influence measurement uncertainty
how to minimize measurement uncertainty and produce accurate and reliable measurement
the five steps for reliable VNA measurements
how to estimate if a measurement is reliable
Dr. Chris Scholz
Product Manager Vector Network Analyzers
Rohde & Schwarz
Chris Scholz specializes in high frequency characterization and signal integrity tests. With more than 20 years of experience he has held positions in Field Applications Engineering for high-speed serial standards, led product development in integrated silicon photonics devices at Intel and as a research faculty at GaTech working on millimeter Wave technology and equalizer ICs for fiber-optical communications systems. In addition to a Ph.D. in Electrical Engineering he also has an MS from Georgia Tech and University of Braunschweig

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