A New Method for Dielectric Property Measurements
Thursday, Feb 28
09:30:00 PM · IST
Dielectric properties are important for design of antenna and wireless technologies. As the internet of things, 5G, automotive sensing, and other advanced technologies become more prevalent, product designers and manufacturers require accurate material properties for ensuring their devices operate as desired. This webinar will provide information about dielectric materials measurements and introduces a new dielectric measurement method, called the “epsilometer”. This method was developed to make dielectric property measurement accessible to the device designer. Not only was it designed with advanced computational electromagnetic design tools, but it was specifically engineered to make dielectric measurements both affordable and easy to do. This webinar will overview the new epsilometer method and give examples of how it can measure a variety of dielectric materials used to manufacture of wireless devices (e.g. substrates, radomes, etc.).
- Overview of dielectric materials measurement methods
- Introduction to technologies that enable improved material measurements
- Overview of the epsilometer, a new and more affordable way to obtain material dielectric properties
Dr. John Schultz
Chief Scientist at Compass Technology Group
Dr. Schultz is the Chief Scientist at the Compass Technology Group where he leads research and development efforts in RF materials and measurement technology. Previously he was a Technical Fellow at the Georgia Tech Research Institute, where he led programs in experimental and computational research on the electromagnetic properties of materials, structures, and antennas. He has developed materials characterization methodologies via free-space, waveguide, resonant cavity, and impedance analysis instrumentation. He has also modeled electromagnetic composite materials and developed new composite material concepts for novel antenna applications. He has used thermal analysis, microscopy, and analytical techniques to correlate microstructure to macroscopic properties in his research for providing new insight into electromagnetic material characteristics. Dr. Schultz has also developed new techniques for microwave measurement of scatter phenomena and has applied these techniques to materials ranging from composites to camouflage nets. Dr. Schultz’s backscatter methodologies have become an accepted standard method for characterizing diffuse microwave scatter in numerous government and industrial laboratories. In previous positions, he has worked in the areas of novel polymer processing including stereolithography, polymer film formation, and conductive polymers.