Increase Measurement Confidence: 7 Proven Methods

  • Webinar Date

    June 02, 2020

  • Webinar Time

    3:00 PM Eastern Daylight Time

Webinar Overview

Our webinar reviews the electrical measurement challenges associated with some of the most common devices and applications that require testing. We’ll look at the problems associated with the measurement of transistors and various diode types, as well as power management applications and some specialty applications like Laser Diode LIV and battery discharge testing. 

We will explore challenges you’ll likely to encounter, including pulse testing to avoid device damage, the thyristor effect, i.e., the “kink” in an I-V curve found in optoelectronic devices, and test synchronization. Following this, we will review instrumentation and the role it can play in reducing or exacerbating measurement challenges. For the applications under review we will show how a source measurement unit (SMU) instrument with its ability to simultaneously source and measure voltage and current offers the potential to increase measurement accuracy and precision and take the place of as many as 5 separate instruments.  

By watching this webinar, you will learn:

  • The  key measurement challenges found in today’s most common electrical device types/applications
  • Key issues in addressing those measurement challenges
  • The role of instrumentation selection in addressing those challenges
  • The advantages of using a SMU instrument as an alternative to other instrument types


John Tucker, Product Marketer, Tektronix Inc.

John Tucker is the Product Marketer for the Keithley Source Measure Unit product line of Tektronix, Inc. He has been with Keithley for over 30 years, serving in a variety of positions including test engineer, applications engineer, applications manager, product manager, and business development manager.