Fundamentals of Materials Measurement and Characterization

  • Webinar Date

    January 20, 2016

  • Webinar Time

    1 p.m. ET / 10 a.m. PT

Webinar Overview

Why this Webcast is Important:
Understanding the properties of materials (both natural and man-made) is important for a variety of reasons. 

Materials such as metallic materials, semiconductors, organic materials (such as polymers) and compound semiconductors have provided profound benefits over the last century. New and emerging materials such as oxide semiconductors, carbon nano tubes (CNT) and graphene promise to provide new benefits over the coming century.

Every material is unique in in terms of its electrical, optical and structural properties. It is these unique material properties that allow devices and components such as solar cells, sensors, logic devices, memories, interconnect, displays, emitters and packaging materials to perform their specified tasks. In turn, the devices and components just described can be used in other equipment such as machines, transportation equipment, IT gadgets, etc.

For these reasons, innovations in material science and engineering form the basis for many next generation technologies and products. The various test methods discussed in this webbcast form an important basis for these innovations.

Who should view this webcast:
Engineers, scientists and materials researches who need to characterize the electrical and physical properties of advanced materials would benefit from attending this webcast.

Presented by:  
Alan  Alan Wadsworth 
 Market Development  Manager
 Keysight Technologies

Alan Wadsworth has been the North and South American Market Development Manager for Keysight’s semiconductor test division for the last six years. Alan started working for Keysight’s parametric test division in 1996, functioning in a number of technical and marketing roles before taking on his current job. Alan has over 30 years of experience in the semiconductor industry in both design and test.  He is also the author of Keysight’s Parametric Measurement Handbook, which contains over 200 pages of information on semiconductor parametric test and measurement techniques.

Alan joined Hewlett Packard in 1991 and worked for five years as the SRAM engineer in HP’s Memory Technology Center, which was part of Corporate Procurement. Prior to that Alan worked as an integrated circuit designer at Signetics/Philips for nine years where he designed circuits in both bipolar and BiCMOS technologies.

Alan holds bachelors and masters degrees in electrical engineering from the Massachusetts Institute of Technology and an MBA from Santa Clara University.