Techniques for Pulsed S-Parameter Measurements

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  • Author: David Vondran
Many devices, par-ticularly power devices, are not designed to operate con-tinuously or with CW sig-nals. This is especially true when devices are being tested on-wafer, where the thermal resis-tance is greatly increased [1]. In these cases, S-parameter measure-ments are best performed in a pulsed test environment.
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