Testing RF Front-End ICs with the Semiconductor Test System

The Semiconductor Test System (STS) series from National Instruments features production-ready test systems that combine the NI PXI platform, TestStand test management software, and LabVIEW graphical programming inside a fully enclosed test head. Its “tester-in-a-head” design houses all the key components of a production tester including system controllers; DC, AC, and RF instrumentation; device under test (DUT) interfacing; and device handler/prober docking mechanics. Download an in-depth white paper that uncovers how a platform-based approach can bridge the gap from characterization to production.

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