Combining Near-Field Measurement and Simulation for EMC Radiation Analysis

Electronic components are required to comply with the global EMC regulations to ensure failure free operation. Currently, EMC measurements in certified institutes are mandatory to certify performance complies with regulations. Since these measurements are performed at the end of the product design process, failing an EMC test can imply a costly redesign. However, the process that is outlined in this paper enables EMC testing to be performed earlier in the design cycle.

This paper describes a practical method of combining near-field measurements and simulations to explore the radiation behavior of electronic components. This approach enables not only near-field characterizations and far-field predictions, but also detailed system level analysis of how the component radiates in its installed environments. For example, how an electronic control unit (ECU) performs when installed in a vehicle.

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