Pulsed Measurement Capability of CMT VNAs

Pulsed S-parameter measurements are important when testing a DUT at a higher power than it can handle without damage in the steady state, or when the normal operating mode of the DUT involves RF pulses. Examples include amplifier chips or circuits without their thermal packages and radar components or systems.

This application note demonstrates how the minimum measurement window and trigger timing behavior of CMT VNAs can be experimentally verified. It was developed based on the 8 GHz Planar 804/1 VNA using v3.49 software. To ensure the measurement settings and pulse timing match the descriptions in this application note, please install v3.49 software or later.