A Vector Network Analyzer (VNA) natively measures complex S-parameters of a device under test (DUT) in the frequency domain mode by sweeping across various frequency points. While there is an exhaustive list of measurements that can be accomplished in the standard frequency domain mode – using the advanced inverse Chirp z-transformation, the measurements can also be simultaneously analyzed in the time domain mode. This gives the added advantage where the two fundamental modes of analysis can be performed by one single instrument.

For an RF/Microwave engineer, time domain measurements are primarily useful in identifying a device’s behavior at specific locations. And more recently, with the increasing necessity of high-speed applications, VNAs are also gaining popularity with digital engineers for signal integrity tests.