Accelerate Your Test Capability and System Productivity with New MEMS Switches

Download Whitepaper
  • Author: Richard Houlihan, Naveen Dhull & Padraig Fitzgerald

Advanced digital processor ICs require separate DC parametric and high speed digital automatic test equipment (ATE) passes for quality assurance.This creates significant cost and logistical challenges. This article explains how the ADGM1001 SPDT MEMS switch facilitates a one pass single insertion test for both DC parametric and high speed digital tests, reducing test cost and simplifying logistics for digital/RF system on chip (SoC) testing.

Please note: By downloading a white paper, the details of your profile might be shared with the creator of the content and you may be contacted by them directly.