Modern VNA Test Solutions Improve On-wafer Measurement Efficiency

Semiconductor manufacturing test engineers face increased challenges today related to broadband millimeter wave (MMW) on-wafer testing. Developing accurate models often requires measuring frequencies that range from near DC up to 100+ GHz. While in the past the need for higher frequencies was based on the need to capture harmonic content, today there are many millimeter wave applications driving on-wafer testing to frequencies exceeding 100 GHz.