A Constant Mismatch Analysis of Power RF Transistors Using EDA Tools
John Pritiskutch and Craig Rotay
The proliferation of EDA tools in the RF industry mainstream has narrowed the traditional separation between RF device designers and the users of those devices. The availability of accurate nonlinear large signal models demonstrate device characteristics by simulation rather than performing tedious, expensive or time prohibitive measurements. Thus, RF device designers and users are more easily able to arrive at a common understanding of an application specific result. Generally, introductory EDA users rely on the embedded circuit analysis templates to provide information on a particular device behavior, but sometimes it is desirable to develop a custom simulation circuit. An example of a custom EDA circuit development is presented here, using Agilent’s EEsof Advanced Design System.
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