Berkeley Nucleonics Corporation to Showcase their Latest RF/Microwave T&M Equipment at AOC 2022

Berkeley Nucleonics Corporation to Showcase their Latest RF/Microwave T&M Equipment at AOC 2022

Berkeley Nucleonics Corporation, a leading electronic instrumentation manufacturer, will attend the 59th Annual AOC International Symposium and Convention in Washington, DC, on October 25-27, 2022. The experienced San Rafael team will be in attendance throughout the entire event, meeting with attendees to discuss their current projects and applications and how BNC can help. Visitors attending the 59th annual AOC International Symposium and Convention will be able to find the BNC team at Booth 607.

Founded in 1963, the California-based company has become one of the global leaders in the manufacture of precision electronic instrumentation for testing and measurement, radiation detection, nuclear research, and RF/microwave. At the symposium, they will showcase their innovative array of cutting-edge signal sources, phase noise testers, and other test and measurement equipment.

Speaking ahead of the event, Allan Gonzalez, Vice President at Berkeley Nucleonics Corporation added, “We are really excited to be heading to the 2022 AOC International Symposium and Convention. It is one of the biggest events in our industry and is a fantastic opportunity for our team to meet with both military and government professionals, as well as allow them to learn more about our extensive range of products. Our experienced team is going to be in attendance throughout the three days, and we are really looking forward to meeting as many attendees as possible.”

Considered the premier event for electronic warfare, electromagnetic spectrum operations, cyber-electromagnetic activities, and information operations professionals, the annual AOC International Symposium and Convention will welcome over 2,000 industry, military, and government individuals over the three days.

Click here to view everything RF's coverage of the 59th Annual AOC International Symposium & Convention.

Publisher: everything RF
Tags:-   Test & Measurement