Multiport and Multi-Site Test Optimization Techniques

  • Date: ┬áJune 3, 2015
  • Event Time: 10am PT/ 1pm ET/ 5pm UTC

Webinar Overview

Why this webcast is important: 
With the trend towards adding more ports on components such as filters, cables, front end modules and antennas, accurate and fast multiport network analysis is required. Optimizing your vector network analyzer (VNA) configuration is critical to minimizing manufacturing cost-of-test. Keysight's new PXI-based VNA drastically improves the test speed for multiport devices by eliminating the switching time required for conventional multiport test sets. The single slot modular PXI form factor enables new possibilities for multi-site measurements (multiple-device parallel measurements) by allowing multiple VNAs to fill the same space as a single benchtop VNA. This webcast provides an overview of multiport and multi-site capabilities, how different multiport test solutions compare, calibration methods, and what considerations need to be made when configuring a multi-site test station.

Who should view: 
RF/uW component manufacturers and users in R&D and production.

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