Single Event Effects in Ultra CMOS Devices
Single Event Effects are cause by a single, energetic particle which can originate from the ions in a cosmic ray (galactic or solar origon) or from a high energy proton. Two major types of Single Event Effects are described below; Single Event Upsets (SEU) are considered soft-errors and are non-destructive. Single Event Latchups (SEL) are hard errors and can be potentially destructive to the device.
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