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An integral part of modern RF/microwave circuit design is circuit simulation and evaluation in which scattering parameters (S-parameters) for each element of a system are utilized to predict the overall small signal performance as the elements are cascaded to form the entire system. The value and effectiveness of these evaluations are directly related to the accuracy of the S-parameters for each component, among other factors. This paper describes the methodology employed by Skyworks to make accurate S-parameter measurements for discrete RF/microwave components.
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