Designers and manufactures of today’s high performance OCXOs, CROs, DROs, TCXOs, SAW oscillators, etc. are pushing phase noise measurement floor requirements to the theoretical limits. In some cases, even beyond what has historically been considered impossible. Oscillator manufacturers and engineers who are tasked to evaluate the performance of ultra-low phase noise oscillators demand a phase noise test system that can accurately measure their devices with the fastest acquisition speeds possible.
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