Manual Probe Stations & Systems

36 Manual Probe Stations & Systems from 8 Manufacturers meet your specification.

Manual Probe Stations & Systems are used to control the position of probes used for semiconductor device and wafer testing. Manual Probe Stations & Systems from the leading manufacturers are listed below. Use the parametric search tools to narrow down on products by frequency, type, chunk size and various other parameters. View product details, download datasheets and get quotes on matching products.

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  • Type: Manual
Description:200 mm Manual Probe System
Type:
Manual
Measurements Type:
DC, RF
Chuck Size:
200 mm
Chuck to Platen Height:
28 mm
Chuck Travel Range:
255 x 325 mm
Chuck Travel Resolution:
1 µm
Microscope Travel Resolution:
5 µm
Microsope Movement Range:
2 x 2 Inches
Connectors:
Kelvin Triax, Kelvin Triax - Female
more info
Description:Manual Probe Station
Type:
Manual
Measurements Type:
DC, RF
Chuck Size:
11 to 200 mm
Chuck Travel Range:
11 to 200 mm
more info
Description:150 mm RF Probe Station
Type:
Manual
Measurements Type:
DC, RF
Chuck Size:
150 mm
Chuck Travel Range:
152.4 x 152.4 mm
Microsope Movement Range:
2 x 2 Inches
more info
Description:200 mm Manual Probe System with Local Enclosure for reliable and accurate DC/CV, RF and mmW measurements
Type:
Manual
Measurements Type:
DC, RF
Chuck Size:
200 mm
Chuck to Platen Height:
38.1 mm
Chuck Travel Range:
200 x 200 mm
Chuck Travel Resolution:
0.1 µm
Microscope Travel Resolution:
2 µm
Microsope Movement Range:
2 x 2 Inches
Connectors:
BNC, BNC - Female
more info
Description:2.5 x 6.5 Inches RF Probe Station
Type:
Manual
Measurements Type:
RF
more info
Description:Semiautomatic probe system
Type:
Manual, Semi Automatic
Chuck Size:
200 mm
Chuck Travel Range:
205 x 205 mm
Chuck Travel Resolution:
0.1 µm
Microscope Travel Resolution:
0.5 µm
Microsope Movement Range:
15 mm
more info
Description:150 mm Manual Probe System
Type:
Manual
Measurements Type:
DC, RF
Chuck Size:
150 mm
Chuck to Platen Height:
28 mm
Chuck Travel Range:
180 x 300 mm
Chuck Travel Resolution:
1 µm
Microscope Travel Resolution:
5 µm
Microsope Movement Range:
2 x 2 Inches
Connectors:
BNC, BNC - Female
more info
Description:150 mm RF Probe Station
Type:
Manual
Measurements Type:
DC, RF
Chuck Size:
150 mm
Chuck Travel Range:
152.4 x 152.4 mm
Microsope Movement Range:
2 x 2 Inches
more info
Description:Easy-to-use 20 GHz RF Probing Solution
Type:
Manual, Semi Automatic
Measurements Type:
RF
more info
Description:200mm High Performance Manual Probe System For Reliable and Accurate RF-mmW, DC/CV, and High Power Test Measurements
Type:
Manual
Frequency:
Up to 110 GHz
Measurements Type:
DC, RF
Chuck Size:
200 mm
Chuck to Platen Height:
38.1 mm
Chuck Travel Range:
205 x 205 mm
Chuck Travel Resolution:
1.5 to 14 µm
Microscope Travel Resolution:
2 µm
Microsope Movement Range:
2 x 2 Inches
Connectors:
BNC, BNC - Female
more info

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