Fill one form and get quotes for cable assemblies from multiple manufacturers
This paper describes and rigorously validates single- and multiple-layer models of microstrip conductor loss appropriate for high-accuracy application in electromagnetic analysis software. The models are validated by comparison with measurement and by comparison with converged results. It is shown that in some cases an extremely small cell size is needed in order to achieve convergence. Several effects that make a significant contribution to loss and are not modeled by the classic square root of frequency loss model are investigated including dispersion and current on the side of transmission lines. Finally, the counterintuitive result that there is an optimum metal thickness for minimum planar conductor loss is explored.
Create an account on everything RF to get a range of benefits.
By creating an account with us you agree to our Terms of Service and acknowledge receipt of our Privacy Policy.
Login to everything RF to download datasheets, white papers and more content.
Fill the form to Download the Media Kit
Content submitted here will be sent to our editorial team who will review and consider it for publication on the website. you will be emailed if this content is published on everything RF.
Please click on the button in the email to get access to this section.