Improving T/R Module Test Accuracy and Throughput

Phased arrays have been used in radar applications for many decades. Recent trends are driving their adoption into other applications such as electronic warfare (EW), satellite systems and even 5G communications. There are several new component technologies that are behind this migration: multiple T/R modules on a chip, higher performance PCB laminates and the acceptance of GaN as a power amplifier (PA) semiconductor process.

This white paper provides an overview of the basic building blocks of a phased array system and discusses how the nature of their design leads to a challenging test environment. It shows how the R&S®ZVAX-TRM expands the capabilities of the R&S®ZVA to perform a wide range of T/R module measurements with just a single connection. Real measurement configuration examples are shown to highlight the flexibility required for T/R module testing.

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By downloading a white paper, your contact information will be shared with the sponsoring company, Rohde & Schwarz GmbH & Co.KG and the Rohde & Schwarz entity or subsidiary company mentioned in the imprint of, and you may be contacted by them directly via email or phone for marketing or advertising purposes subject to their statement of privacy.