Anritsu to Showcase Next Generation Test and Measurement Solutions at IMS 2026

Anritsu to Showcase Next Generation Test and Measurement Solutions at IMS 2026

Anritsu will exhibit its latest advancements in RF and microwave test and measurements at IMS 2026, world’s premier RF and microwave conference. At Booth 17054, the company will present a series of live demonstrations and short technical sessions focused on addressing the growing complexity of high-frequency and wideband systems. In their MicroApps Seminar, they will focus on AI in test and measurements. 

The company’s exhibit will have Test and measurement instruments including network analyzers, spectrum analyzers, signal generators, oscilloscopes, power meters, and automated test equipment. At their booth attendees can expect:

  • Live demonstrations focused on next-generation test challenges 
  • Direct access to engineers and technical experts 
  • Solutions designed for high-speed, high-frequency applications 
  • A preview of upcoming innovations shaping the future of test and measurement 

Attendees can engage directly with Anritsu engineers to explore practical approaches to system testing, measurement accuracy, and performance optimization. At their booth, Anritsu will also host scheduled presentations twice daily at 10:00 AM and 2:00 PM, providing quick insights into emerging technologies and application-focused use cases.  

Anritsu IMS 2026 Banner


Anritsu MicroApps Seminar 


Artificial Intelligence Driving Next-Generation Test and Measurement Instrumentation 

When & Where: 11:44 am – 11:59 am | June 11 | MicroApps Theater, IMS Exhibit Hall 

Session Number: THMA8 

Speaker: Navneet Kataria This session focuses on the role of artificial intelligence in modern test and measurement, showing how it is helping engineers manage increasingly complex systems. It explains how AI can improve measurement speed, enable more scalable testing approaches, and provide deeper insights from large and complex data sets. It highlights how these capabilities are becoming essential as RF and wireless systems continue to grow in complexity, requiring more efficient and intelligent testing methods. 


Click here to learn more about Anritsu and see IMS 2026 Coverage.

Publisher: everything RF

Anritsu

  • Country: United States
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