Presto Engineering, a semiconductor product engineering and supply chain management, and Peraso Technologies, a leading wireless chipset manufacturer, have jointly announced their successful collaboration in developing a comprehensive test solution for Peraso’s recently-launched 60 GHz semiconductor products.
The Peraso chipset is currently in production with Presto providing test services at volumes of tens of thousands of parts per month. The solution is the first phase of a project that will culminate in a high-efficiency test solution – 40X faster and capable of supporting high-volume production (millions of devices per month) for the consumer electronics market – planned for later this year. The 60 GHz spectrum provides the foundation for WiGig technology, and with the increased demand for faster wireless connectivity, is quickly changing how users stream and connect to the Internet.
This collaboration with Peraso allowed Presto to combine their extensive experience in RF test with Peraso's expertise in 60 GHz ICs to develop a solution for high-speed/low-cost testing where none previously existed. They have made significant progress in the next phase of the development that will offer significantly reduced test times and an overall lower cost of test.
The Peraso X610 WiGig chipset constitutes a complete baseband to 60 GHz solution and is compliant with the single carrier modulation and coding schemes of the IEEE 802.11ad specification. Incorporating the PRS4601 WiGig baseband IC and the PRS1126 WiGig transceiver, the chipset provides the core functionality for a low-cost, high-performance multi-gigabit per second solution that operates across the industrial temperature range. As manufacturers continue to seek solutions to bring WiGig®-enabled devices quickly to market, Presto and Peraso remain at the forefront, driving down the cost and implementation time with this revolutionary test solution.
The testbed consists of a set of custom hardware components mounted on an automated test equipment (ATE) load board, and associated test programs, that together provide comprehensive automated testing of both baseband (~2 GHz) and high frequency (60 GHz) functionality.
